Electronic Components and Devices
Table of
Contents
2.1 BIPOLAR JUNCTION TRANSISTOR (BJT)
2.3 OPERATION OF NPN TRANSISTOR
2.4 OPERATION OF PNP TRANSISTOR
2.7 EARLY EFFECT OR BASE-WIDTH MODULATION
3.1 METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR
(MOSFET or IGFET)
3.4 SILICON CONTROLLED RECTIFIER (SCR)
4.2 LIGHT DEPENDENT RESISTOR(LDR) OR PHOTORESISTOR:
4.4 AVALANCHE PHOTO DIODE (APD)
5.2 HALF-WAVE RECTIFIER (A.C. voltage into a pulsating D.C. voltage)
5.3 FULL-WAVE RECTIFIER (A.C. voltage into a pulsating D.C. voltage)
5.4 BRIDGE RECTIFIER (A.C. voltage into a pulsating D.C. voltage)
6.1 VOLTAGE REGULATION USING ZENER DIODE (Gives
Constant Output Voltage)
6.2 ZENER DIODE SHUNT REGULATOR
1.1 SEMICONDUCTOR
DIODES
INTRODUCTION
The
aim of Electronic component is to act as switch.
The
atom structure is show in fig.
Atom = Nucleus(Protons + Neutrons) +
Electrons
The outermost
electron in the atom is called as valance electron.
Fig: 1.1 Atom structure
Basically
there are three material in nature. They are Conductor, Semiconductor and
Insulator. Conduction in all this material starts when the electrons in
conduction band moves to the valance band.
For
conductor, the conduction and valance band already overlap, so without any
external voltage it starts conducting due to normal room temperature (Noise).
For
insulator, the conduction and valance band is separated with larger band gap
which need very high energy to move the electron from conduction band to
valance band. This will fulfill our aim to act as switch but with very high
energy is need.
For
Semiconductor, the conduction and valance band separated with small band gap
which needs low energy to move the electron from conduction to valance band. In
case of semiconductor this will act as switch with low energy which will
fulfill our aim.
·
Intrinsic semiconductor(Pure)
·
Extrinsic semiconductor(Impure or Doped)
o
N-Type semiconductor(Electrons are majority
carrier)
o
P- Type semiconductor(Holes are majority
carrier)

Fig:1.2
Conduction and Valance band of
Insulator, Semiconductor and Conductor
1.2
INTRINSIC SEMICONDUCTOR
It is a Pure
semiconductor without any impurities. Fig 1.2 shows the energy band diagram of
intrinsic semiconductor. For Ge(Germanium) material electrons take 0.67 eV to
reach conduction band from valance band and for Si(silicon) 1.1 eV. But silicon
is cheaper than germanium. That’s why silicon is used widly.

Fig: 1.3 Intrinsic Semiconductor
To reduce
the energy further, should reduce the band gap. This is done by means of
doping.
Doping- Process of adding impurities in intrinsic semiconductor.
1.3
EXTRINSIC SEMICONDUCTOR
All the dopped semiconductors are called as Extrinsic
semiconductor.
If the
dopped atom creats excess electron in the atom means then it is called as N-
Type semiconductor. Electrons are majority carriers. Holes are minority
carriers. (i.e.,) Pentavelant impurities are used for doping (Arsenic(As),
Antimony(Sb), Phosphorous(P)).
If the
dopped atom creats holes in the atom means then it is called as P-Type
semiconductor. Holes are majority carriers. Electrons are minority carriers.
(i.e.,) Trivalent impurities are used for doping (Boron(B), Gallium(Ga),
Indium(In)).

Fig: 1.4 (a) N-Type Semiconductor, (b) P-Type Semiconductor
This P-Type and N-Type Jointly form
the PN doide.
1.4
PN JUNCTION DIODE
Combination of P and N type
semiconductor is called as PN junction diode. It is lightly doped diode.
Symbol
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Fig: 1.5 Circuit symbol
Construction of PN Junction Diode
- P-Type and N-Type semicondutor combined to form the PN
junction diode.

Fig: 1.6 PN Junction Diode
- In P side, each acceptor atom accepts one electron from semiconductor
atom and the acceptor atom become immobile negative ion and semiconductor
atom become hole. The P side has excess holes.
- In N side, each donor atom donate one electron and the
donor atom become immobile positive ion, there is one free electron for
each positive immobile ion. The N side has excess electrons.
Depletion Region
- Electrons move from N side to P side and recombine with
holes in the P type material. Because of this movement and recombination,
electrons in N type and holes in P type material disappear.

Fig: 1.7 Space Charge region (or)
Depletion region
- Near the junction there will be an array of negative and
positive immobile ions, which will block the electron hole mobility from
one side to another. An equilibrium condition will be reached.
- This region near the junction, which consist of immobile
ions, is called space charge region or transision region or depletion
region(no mobile carriers).
Barrier Potential
- In depletion
region there are positive charges in the N side and negative charges in
the P side forms electric dipole layer, giving rise to a potential
difference Vo. This potential difference is called barrier
Potential.
- It prevent the movement of mobile carriers across the
junction. Vo is 0.3 V for Ge and 0.7 V for Si.
Operation of PN Junction Diode(VI Characteristics)
- There are two
main operation
- Forward bias
- Reverse bias
·
Bias is nothing but applying
external voltage.
Forward Bias
(Batteries Positive
terminal is connected to P type and Negative terminal is connected to N type)

Fig: 1.8 Diode in Forward Bias
- When an external voltage is applied, the holes in the P
type material are repelled by the positive terminal of the battery, and
the electrons in the N type material are repelled by the negative terminal
of the battery, Which will reduces the width of the depletion region.
Further increase in external voltage above the barrier potential voltage,
then the depletion region gets broken. Holes cross the junciton and move
towards negative terminal of the battery and electrons moves towards
positive terminal of the battery.
- Due to this movement of charges, produces a high forward
current, which is show in the forward VI characteristics.
- When the applied voltage reaches the barrier potential
then the junction break down occurs which increases the flow of electrons.
The point at which diode starts conducting in forward bias is called as knee voltage or cut in voltage or threshold voltage
Reverse Bias
(Batteries
Positive terminal is connected to N type and Negative terminal is connected to
P type)

Fig: 1.9 Diode in Reverse Bias
- When an external voltage is applied, the holes in the P
type material are attracted by the negative terminal of the battery, and
the electrons in the N type material are attracted by the positive
terminal of the battery, Which will increases the width of the depletion
region and barrier potential. The high barrier potential will not allow
charge carriers to move across the junction. Therefore in reverse bias no
current flow through the junction.
- PN
junction diode offers very low resistance in forward bias and very high
resistance in reverse bias.
- When
the voltage across the diode is increased, the depletion layer is
strengthened, therefore the current through the diode is the reverse
saturation current. Further increase in reverse voltage will suddenly increases
the high reverse saturation current due to the breakdown of the diode. The
minimum voltage at which the breakdown occurs is called breakdown voltage.

Diode Current Equation or Shockley Diode
Equation
- The
mathematical equation which describes the forward and reverse
characteristic of a semiconductor diode is called diode current equation.

Where,
I = forward (reverse) diode current
Io = reverse saturation
current
V = external voltage, it is positive
for forward bias and negative for reverse bias
= 1 for Ge and 2 for Si
VT = volt equivalent of
temperature
Application
- Diode
can be used as switch, because it offers very low resistance (Closed
switch) in forward bias and very high resistance (open switch) in reverse
bias.
- Diode
can be used as rectifier to convert AC signal into DC signal.
1.5 ZENER DIODE
·
Zener diode is a heavily doped PN
junction diode.
·
Depletion layer is very thin (due
to heavy doping).
·
Junction electric field is strong
therefore lower applied reverse voltage is enough to cause the breakdown. Which
is called as Zener breakdown.
·
Zener breakdown is sharp
Symbol

Fig: 1.21 Circuit symbol
V-I Characteristics
·
Forward bias
·
Reverse bias
Bias- applying external voltage

Fig: 1.21 V-I Characteristics of Zener
diode
Forward Bias
(Batteries Positive terminal is connected to P type and
Negative terminal is connected to N type)
In forward biased
condition Zener diode acts as the ordinary PN junction diode.
- When an external voltage is applied, the holes in the P
type material are repelled by the positive terminal of the battery, and
the electrons in the N type material are repelled by the negative terminal
of the battery, Which will reduces the width of the depletion region.
Further increase in external voltage above the barrier potential voltage,
then the depletion region gets broken. Holes cross the junciton and move
towards negative terminal of the battery and electrons moves towards
positive terminal of the battery.
- Due to this movement of charges, produces a high forward
current, which is show in the forward VI characteristics.
Reverse Bias
(Batteries Positive terminal is connected to N type and
Negative terminal is connected to P type)
·
At a reverse voltage the electric
field in the depletion layer will be strong enough to break the covalent bonds.
This produces extremely large number of electrons and holes and heavy current
flow through the junction causing breakdown. The zener breakdown voltage depends
on the amount of doping.
Application
·
In the zener breakdown region
voltage across the diode remains constant over a wide range of current,
therefore zener diode can be used as Voltage
regulator.
1.6 BREAKDOWNS IN
DIODE
In reverse bias, breakdown of the
junction occurs by two mechanisms, they are Zener Breakdown and Avalanche
Breakdown.
Zener Breakdown
Zener breakdown takes place in
a heavily doped diode. In a heavily doped diode the depletion layer will be
thin and the electric field in the depletion layer will be high. When a small
reverse bias voltage is applied, a very strong electric field (about 107 V/m)
is set up across the thin depletion layer. This field directly breaks or
ruptures the covalent bonds. Now extremely large number of electrons and holes
are produced and the current through the diode increases rapidly. This
mechanism is called Zener Breakdown.
Avalanche Breakdown
Avalanche breakdown takes
place in lightly doped diode, whose depletion layer is large and the electric
field across the depletion layer is not so strong to break covalent bond. In
the depletion layer thermally generated minority carriers are accelerated by
the electric field. The minority carriers move with high speed and collide with
atoms. Due to the collision covalent bonds are broken and electron hole pairs
are generated. These new carries so produced are also accelerated by the field
and they break more covalent bonds. This forms a cumulative process is called
as avalanche (or flood)
multiplication and the current through the diode increases rapidly. This
breakdown is called as avalanche
breakdown.
2.1 BIPOLAR
JUNCTION TRANSISTOR (BJT)
- Transistor
is a two junction, three terminal device.
- Conduction
due to both majority and minority charge carriers. (i.e., Bipolar).
Construction

Fig: 2.1 Transistor (a) NPN & (b) PNP
- Transistor
is simply a sandwich of one type semiconductor material between two layers
of other type. There are two types of Transistor, they are
- NPN transistor – P
type material is sandwich between two layer of N type material.
- PNP transistor - N
type material is sandwich between two layer of P type material.

Fig: 2.2 Circuit symbol of (a) NPN & (b) PNP Transistor
- Arrowhead should be at the emitter
terminal. It indicates the directional of current flow when emitter base
junction is forward biased.
Terminals
Emitter: The main function of this
region is to supply majority charge carriers to the base. Emitter region is
more heavily doped when compared with other regions.
Base: The middle section of the
transistor is known as base. Base region is very lightly doped and is very thin
as compared to either emitter or collector. It is made very thin to reduce
recombination of charge carriers in the base region.
Collector: The main function of the
collector is to collect majority charge carriers through the base. Collector
region is moderately doped. The collector region is made physically larger than
the emitter region. This is due to the fact that collector has to dissipate
much greater power. Due to this difference, collector and emitter are not
interchangeable.
Operating Modes
Transistor can be considered as two diodes
connected back to back. Consider current
flowing from collector to emitter of an NPN. It is operated in three regions

Fig: 2.3 Graphical representation of different regions with
its voltages
- Saturation – The transistor acts like a short circuit. Current
freely flows from collector to emitter. i.e., both collector base and
emitter base junction are forward biased
- Cut-off – The transistor acts like an open circuit. No current
flows from collector to emitter. i.e., both collector base and emitter
base junction are Reverse biased
- Active -
Emitter base junction is Forward biased and collector base junction is
Reverse biased
- Active – Forward Active: The current from collector to
emitter is proportional to the current flowing into the base.
- Active – Reverse Active: Like
forward active mode, the current is proportional to the base current, but
it flows in reverse. Current flows from emitter to collector.
2.2 TRANSISTOR
BIASING
As
shown in fig 2.4, usually the emitter-base junction is forward biased (F.B) and
collector-base junction is reverse biased (R.B). Due to the forward bias on the
emitter-base junction, an emitter current flows through the base into the
collector. Though the collector-base junction is reverse biased, almost the
entire emitter current flows through the collector circuit.

Fig:
2.4 Transistor biasing (a) NPN transistor and (b) PNP transistor
2.3 OPERATION OF
NPN TRANSISTOR
As
shown in fig 2.5, the forward bias applied to the emitter base junction of an
NPN transistor causes a lot of electrons from the emitter region to crossover
to the base region. As the base is lightly doped with P-type impurity, the
number of holes in the base region is very small and hence the number of
electrons that combine with holes in the P-type base region is also very small.
Hence a few electrons combine with holes to constitute a base current IB. The
remaining electrons (more than 95%) crossover into the collector region to
constitute a collector current IC. Thus the base and collector current summed
up gives the emitter current, i.e.
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Fig:
2.5 Current in NPN transistor
In the
external circuit of the NPN bipolar junction transistor, the magnitudes of the
emitter current IE, the base current IB and the collector current IC are
related by
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2.4 OPERATION OF
PNP TRANSISTOR
As shown in fig 2.6,
the forward bias applied to the emitter-base junction of a PNP transistor
causes a lot of holes from the emitter region to crossover to the base region
as the base is lightly doped with N-type impurity. The number of electrons in
the base region is very small and hence the number of holes combined with
electrons in the N-type base region is also very small. Hence a few holes
combined with electrons to constitute a base current IB. The remaining holes
(more than 95%) crossover into the collector region to constitute a collector
current Ic. Thus the collector and base current when summed up gives the
emitter current, i.e.
![]()

Fig:
2.6 Current in PNP transistor
In
the external circuit of the PNP bipolar junction transistor, the magnitudes of
the emitter current IE, the base current IB and the collector current Ic are
related by
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This
equation gives the fundamental relationship between the currents in a bipolar transistor
circuit. Also, this fundamental equation shows that there are current
amplification factors α and β in common base transistor configuration and
common emitter transistor configuration respectively for the static (D.C)
currents, and for small changes in the currents.
2.5 TYPES OF
CONFIGURATION
Depending upon the common terminal between the input and output of
the transistor, three configurations are classified. They are: (i) Common base
(CB) configuration, (ii) common emitter (CE) configuration, and (iii) common
collector configuration.
(i) (CB) configuration
This is also called grounded base configuration. In this
configuration, emitter is the input terminal, collector is the output terminal
and base is the common terminal.
(ii) (CE) configuration
This is also called grounded emitter configuration. In this configuration,
base is the input terminal, collector is the output terminal and emitter is the
common terminal.
(iii) (CC) configuration
This is also called grounded collector configuration. In this
configuration, base is the input terminal, emitter is the output terminal and
collector is the common terminal.

Fig:
2.8 Transistor configuration: (a) Common Base, (b) Common Emitter & (c)
Common Collector
2.6 CB
CONFIGURATION
The circuit diagram for determining the static characteristics
curves of an NPN transistor in the common base configuration is shown in fig
2.9

Fig:
2.9 Circuit to determine CB static characteristics
Input Characteristics
To determine the input characteristics, the collector-base voltage
VCB is kept constant at zero volt and the emitter current IE is increased from
zero in suitable equal steps by increasing VEB. This is repeated for higher
fixed values of VCB. A curve is drawn between emitter current IE and
emitter-base voltage VEB at constant collector-base voltage VCB. The input
characteristics thus obtained are shown in fig

Fig:
2.10 CB Input Characteristics
When VCB is equal to zero and the emitter-base junction
is forward biased as shown in the fig 2.10 characteristics, the junction
behaves as a forward biased diode so that emitter current IE
increases rapidly with small increase in emitter-base voltage VEB.
When VCB is increased keeping VEB constant, the width of
the base region will decrease. This effect results in an increase of IE.
Therefore, the curves shift towards the left as VCB is increased.
Output Characteristics
To determine the output characteristics, the emitter current IE
is kept constant at a suitable value by adjusting the emitter-base voltage
VEB. Then VCB is increased in suitable equal steps
and the collector current IC is

Fig:
2.11 CB Output Characteristics
Noted for each value of IE. This is repeated for
different fixed values of IE, Now the curves of Ic versus
VCB are plotted for constant values of IE and
the output characteristics thus obtained is shown in Fig. 2.11
From the characteristics, it is seen that for a constant value of
IE, IC is independent of VCB and the curves
are parallel to the axis of VCB. Further, Ic flows even when VCB
is equal to zero. As the emitter-base junction is forward biased, the
majority carriers, i.e. electrons, from the emitter are injected into the base
region. Due to the action of the internal potential barrier at the reverse
biased collector-base junction, they flow to the collector region and give rise
to Ic even when VCB is equal to zero.
2.7 EARLY EFFECT
OR BASE-WIDTH MODULATION
As the output voltage Vcc increased, the collector base
junction is more reverse biased, therefore the depletion layer width at the
collector junction increases, which reduces the effective width of the base.
This dependency of base-width on collector-to-emitter voltage is known as the Early effect.
This decrease in effective base-width has three consequences:
(i) There
is less chance for recombination within the base region. Hence, α increases
with increasing |VCE|.
(ii) The
charge gradient is increased within the base, and consequently, the current of
minority carriers injected across the emitter junction increases,
(iii) For
extremely large output voltage, the effective base-width may be reduced to
zero, causing voltage breakdown in the transistor. This phenomenon is called
the punch through or Reach through.
For higher values of VCB, due to Early effect, the value of
α increases. For example, α changes, say from 0.98 to 0.935. Hence, there is a
very small positive slope in the CB output characteristics and hence the output
resistance is not zero.
2.8 THERMAL RUN
AWAY
Flow of collector current produces heat in the collector junction
which increases the reverse saturation current ICO, again the IC
increases. This process goes in cumulative way, the heat at the junction
increases and burns the transistor. The process of self-destruction of
transistor is called Thermal Run Away.
2.9 TRANSISTOR
PARAMETERS
The slope of the CB characteristics will give the following four
transistor parameters. Since these parameters have different dimensions, they
are commonly known as common base hybrid parameters or h-parameters.
(i) Input impedance (hib). It is defined as
the ratio of the change in (input) emitter voltage to the change in (input)
emitter current with the (output) collector voltage VCB kept
constant. Therefore,

(ii) Output admittance (hob): It is defined as the ratio of
change in the (output) collector current to the corresponding change in the
(output) collector voltage with the (input) emitter current IE kept
constant. Therefore,

(iii)Forward current gain (hfb): It is defined as a ratio of
the change in the (output) collector current to the corresponding change in the
(input) emitter current keeping the (output) collector voltage VCB constant.
Hence,
![]()
(iv) Reverse voltage gain (hrb): It is defined as the ratio of
the change in the (input) emitter voltage and the corresponding change in
(output) collector voltage with constant (input) emitter current, IE.
![]()
2.10 CE
CONFIGURATION
Input characteristics
To determine the input characteristics, the collector to emitter
voltage is kept constant at zero volt and base current is increased from zero
in equal steps by increasing VBE in the circuit shown in Fig. 2.12.

Fig:
2.12 Circuit to determine CE static characteristics
The
value of VBE is noted for each setting of IB. This procedure is
repeated for higher fixed values of VCE, and the curves of IB Vs. VBE
are drawn. The input characteristics thus obtained arc shown in Fig. 2.13
When VCE =0, the emitter-base junction is forward biased
and the junction behaves as a forward biased diode. Hence the input
characteristic for VCE = 0 is

Fig:
2.13 CE Input Characteristics
Similar to that of a forward-biased diode. When VCE is
increased, the width of the depletion region at the reverse biased
collector-base junction will increase. Hence the effective width of the base
will decrease. This effect causes a decrease in the base current IB.
Hence, to get the same value of IB as that for VCE = 0, VBE
should be increased. Therefore, the curve shifts to the right as VCE
increases.
Output characteristics
To determine the output characteristics, the base current IB
is kept constant at a suitable value by adjusting base-emitter voltage, VBE.
The magnitude of collector-emitter voltage VCE is increased in
suitable equal steps from zero and the collector current Ic is noted for each
setting VCE.

Fig:
2.14 CE Output Characteristics
and ![]()
For larger values of VCE, due to early effect, a very
small change in α is reflected in a very large change in β. For example, when
α=0.98,
If α increases to
0.985, then
Here, a slight
increase in α by about 0.5 results in an increases in by β about 34%. Hence,
the output characteristics of CE configuration show a larger slope when
compared with CB Configuration.
The output characteristics have three regions, namely, saturation
region, cutoff region and active region. The region of curves to the left of
the line OA is called the saturation region (hatched), and the
line OA is called the saturation line. In this region, both junctions
are forward biased and an increase in the base current does not cause a corresponding
large change in Ic. The ratio of VCE(sat) to IC
region is called saturation resistance,
The region below the curve for IB = 0 is called
the cut-off region (hatched). In this region, both junctions are reverse
biased. When the operating point for the transistor enters the cut-off region,
the transistor is OFF. Hence, the collector current becomes almost zero and the
collector voltage almost equals Vcc, the collector supply voltage. The
transistor is virtually an open circuit between collector and emitter
The central region where the curves are uniform in spacing and
slope is called the active region (unhatched). In this region, emitter-base
junction is forward biased and the collector-base junction is reverse biased.
If the transistor is to be used as a linear amplifier, it should be operated in
the active region,
If the base current is subsequently driven large and positive, the
transistor switches into the saturation region via the active region, which is
traversed at a rate that is dependent on factors such as gain and frequency
response. In this ON condition, large collector current flows and collector
voltage falls to a very low value, called VCEsat, typically around
0.2 V for a silicon transistor, the transistor is virtually a short circuit in
this state.
High speed switching circuits are designed in such a way that
transistors are not allowed to saturate, thus reducing switching times between
ON and OFF times.
Transistor parameters
The slope of the CE characteristics will give the following four
transistor parameters. Since these parameters have different dimensions, they
are commonly known as common emitter hybrid parameters or h-parameters,
(i)
Input impedance (hie):
It is defined as the ratio of the
change in (input) base voltage to the change in (input) base current with the
(output) collector voltage VCE kept constant. Therefore,
![]()
(ii) Output admittance (hoe): It is defined as the ratio of change in the (output) collector
current to the corresponding change in the (output) collector voltage with the
(input) base current IB kept constant. Therefore,

(iii) Forward
current gain (hfe). It is defined as a ratio of the
change in the (output) collector current to the corresponding change in the
(input) base current keeping the (output) collector voltage VCE constant.
Hence,

(iv) Reverse
voltage gain (hre): It is defined as the ratio of the
change in the (input) base voltage and the corresponding change in (output)
collector voltage with constant (input) base current, IB. Hence,
![]()
2.11 CC
CONFIGURATION
The circuit diagram for determining the static characteristics of
an NPN transistor in the common collector configuration is shown in fig. 2.15.

Fig:
2.15 Circuit to determine CC static characteristics
Input
characteristics
To determine the input characteristics, VEC is
kept at a suitable fixed value. The base-collector voltage VBC is
increased in equal steps and the corresponding increase in IB is
noted. This is repeated for different fixed values of VEC. Plots
of VBC versus IB for different values of VEC
shown in Fig. 2.16 are the input characteristics.

Fig:
2.16 Input Characteristics
Output
characteristics
The output characteristics are the same as those of the common
emitter configuration.
2.12 COMPARISON
|
Property |
CB |
CE |
CC |
|
Input resistance |
Low
(about 100 Ω) |
Moderate
(about 750 Ω) |
High
(about 750 KΩ) |
|
Output
resistance |
High
(about 450 KΩ) |
Moderate
(about 45 KΩ) |
Low
(about 25 Ω) |
|
Current
gain |
1 |
High |
High |
|
Voltage
gain |
About 150 |
About 500 |
Less than
1 |
|
Phase
shift between input & output voltages |
0 or 360o |
180o |
0 or 360o |
|
Applications |
For high
frequency circuits |
For audio
frequency circuits |
For
impedance matching |
|
Current
amplification factor=(output current)/(input current) |
|
|
|
RELATIONSHIP BETWEEN α AND β
We know that ![]()
By definition, ![]()
Therefore, ![]()
i.e. ![]()
Dividing both sides by
, we get

Therefore, ![]()
and
, or ![]()
From this relationship, it is clear that as α approaches unity, β
approaches infinity. The CE configuration is used for almost all transistor
applications because of its high current gain, β
3.1 METAL OXIDE
SEMICONDUCTOR FIELD EFFECT TRANSISTOR (MOSFET or IGFET)
There are two types of MOSFET, they
are
·
Enhancement MOSFET
·
Depletion MOSFET
3.2 ENHANCEMENT
MOSFET
In enhancement MOSFET, the drain
current is increased by the gate voltage.
Construction
The N channel MOSFET consist of a lightly doped P type substrate.
Two heavily doped N+ regions are formed into the substrate.

Fig:
2.24 N channel Enhancement MOSFET
One N+ region acts as source S and another N+ region acts as drain
D. A thin layer of Silicon dioxide (SiO2) is grown over the surface,
and holes are made in the oxide layer to form metal contacts with source and
drain. The region between the N+ source
and drain is called Channel. The gate metal contact G is made on the SiO2
layer, above the channel. The gate metal and the channel act as the two plates
of a parallel plate capacitor and the SiO2 layer acts as the
dielectric.
OPERATION
The channel is lightly doped P type semiconductor, its resistance
is high therefore electrons cannot move freely from source to drain. When a
Positive voltage is applied at the gate, it induces negative charges in the
channel.
These induced negative charge are
called inversion layer. Now the channel has electrons as carriers, therefore
the conductivity of the channel increases and electrons flow from source to
drain. Thus the drain current is increased (enhanced) by the gate voltage.

Fig:
2.25 Operation of N channel Enhancement MOSFET
Symbol

Fig:
2.26 Symbol of Enhancement N channel and P
channel MOSFET
Drain characteristics
The graph between drain source voltage VDS and drain
current ID for a constant gate source voltage VGS is
called the drain characteristics of MOSFET. For plotting drain characteristics,
gate source voltage VGS is kept constant, the change in drain
current ID is noted for change in drain source voltage VDS.
The variation of ID with VDS for different constant value
of VGS can be obtained and plotted on a graph.

Fig:
2.27 Drain characteristics
When VGS is zero, the
drain current is zero. When VGS is made positive, drain current
increases.
Transfer characteristics
The graph between gate source
voltage VGS and drain current ID for a constant drain and
source voltage VDS is called the transfer characteristics of MOSFET.
For a fixed drain source voltage VDS
voltage, when VGS is zero or negative, very small saturation current
flow through the MOSFET, called IDSS. When VGS is
increased above zero, the drain current, remain at IDSS for small
values of VGS. Above the gate source threshold voltage VGST
the current increases rapidly.
N channel enhancement MOSFET cannot
be operated with gate voltage negative (depletion mode).

Fig:
2.28 Transfer characteristics
3.3 DEPLETION
MOSFET
In depletion MOSFET, the drain
current can be increased or decreased by the gate voltage.
Construction
The N channel depletion MOSFET consist of a lightly doped P type
substrate. Two heavily doped N+ regions are formed into the substrate.

Fig:
2.29 N channel Depletion MOSFET
One N+ region acts as source S and
another N+ region acts as drain D. A lightly doped N type channel is formed
between source and drain. A thin layer of silicon dioxide (SiO2) is
grown over the surface, and holes are made in the oxide layer to form metal
contacts with source and drain. The gate metal contact G is made on the SiO2
layer, above the N type channel. The gate metal and the channel act as the two
plates of a parallel plate capacitor and the SiO2 layer act as the
dielectric.
Operation
The channel is lightly
doped N type semiconductor, therefore electrons can move from source to drain.
Enhancement mode
When a positive voltage is applied
at the gate, it induces negative charges in the channel, therefore the
conductivity of the channel increases and more electrons flow from source to
drain. Thus the drain current is increases (enhanced) by the positive gate
voltage.

Fig:
2.30 N channel depletion MOSFET with Negative
Gate Voltage
Depletion Mode
When the gate voltage is negative,
it induces positive charges in the channel. The induced positive charges reduce
the conductivity of the channel (prevent the movement of electrons from source
to drain); therefore the drain current decreases for negative gate voltage.
Symbol

Fig:
2.31 Symbol of Depletion N channel and P channel
MOSFET
Drain Characteristics
The graph between drain source voltage VDS and drain
current ID for a constant gate source voltage VGS is
called the drain characteristics of MOSFET.
For plotting drain characteristics,
gate source voltage VGS is kept constant, the change in drain
current ID is noted for change in drain source voltage VDS.
The variation of ID with VDS for different constant
values of VGS can be obtained and plotted on a graph.

Fig:
2.32 Drain characteristics
When VGS is zero, small
drain current flow through the MOSFET. When VGS is made positive,
drain current is increases. When VGS is made negative, the drain
current is decreases.
Transfer Characteristics
The graph between gate source
voltage VGS and drain current ID for a constant drain and
source voltage VDS is called the transfer characteristics of MOSFET.
For a fixed VDS voltage,
when VGS is zero small drain current flow through the MOSFET. When VGS
is increased above zero, the drain current is also increased. When VGS
is reduced below zero, the drain current decreases and reaches zero. The gate
source voltage VGS at which the drain current become zero is called
VGS(off), at this voltage the current is completely occupied by the
positive charges, therefore electrons cannot move from source to drain.

Fig:
2.33 Transfer Characteristics
N channel depletion MOSFET can be
operated with gate voltage negative (depletion mode) and with gate voltage
positive (enhancement mode).
3.4 SILICON
CONTROLLED RECTIFIER (SCR)
Diode
and transistor cannot be used as switch in high current. Thyristors (SCR, DIAC
& TRIAC) are semiconductor switch, made to operate in high current
application.
Construction
SCR
is a four layer semiconductor device, which consist of alternate P type and N
type silicon. SCR consists of three junctions J1, J2 and
J3 and three terminals known as anode A, cathode K and Gate G.
The
function of gate is to control the firing of SCR. SCR conducts only in one
direction i.e., from anode to cathode and hence it is called unidirectional
switch.
Symbol
& Structure

Fig:
3.16 (a) Symbol of SCR, (b) structure of SCR
Two Transistor analogy of SCR
The operation of SCR may be explained
by dividing it into two transistors: a PNP transistor T1 and another
NPN transistor T2. Collector of each transistor is coupled to the
base of the other transistor.

Fig: 3.17 Two transistor model of SCR
When
gate is open and VAK is positive and less than the break over
voltage VBO, transistors T1 and T2 remain in cutoff.
Therefore, no current flows through the SCR. When the gate is made positive, a
small gate current flow through the base of T2. This increase its
collector current. As the collector current of T2 is the base
current of T1, T1 is switched ON and its collector
current increases. The collector current of T1 is base current of T2.
Therefore an increase in current of one transistor causes an increase in
current of the other transistor. This process goes in an accumulative way and
both transistors are driven into saturation. Now a heavy current flow through
the load. The SCR is in ON condition.
Operation of SCR
SCR can be operated with gate open or
with positive voltage at the gate. In SCR a load is connected in series with
anode and anode is kept at positive potential with respect to cathode with the
help of a battery.
IG=0 and VAK is positive
When no voltage is applied at the gate(IG=0)
and VAK is positive, junctions J1 and J2 are
forward biased while the junction J2 is reverse biased. Due to the
reverse bias of the junction J2, no current flows through the load RL.
The current flowing through the SCR is very small reverse saturation current.
SCR is said to be in cut-off condition.

Fig:
3.18 SCR with open Gate
When positive voltage at the anode is
increased, the reverse bias at the junction J2 is also increases and
at a particular voltage the junction J2 breaks down. Now the SCR
conducts heavily and is said to be in ON state. The resistance of SCR become
low (0.01Ω to 1Ω) therefore the voltage across the SCR decreases.
The
anode voltage at which the SCR start conducting is called break over voltage. The current at which SCR is switched ON is
called the holding current IH. Holding current is the minimum
current required to keep the SCR in ON condition.
SCR can be used as a switch with VAK
positive.
IG>0 and VAK is positive
When VAK is positive,
junction J1 and J3 are forward biased while the junction
J2 is reverse biased. When the gate is made positive with respect to
cathode, the gate voltage forward biases junction J3. Electrons from
N type material cross the junction J3 and move into P type material,
holes from P type material cross the junction J3 and move in to the
N type material. Electrons are the majority carriers in the P type material,
which can cross the reverse biased junction J2. More electrons that
get energy from the positive voltage can create more carriers and break the
junction J2 for a low VAK, and SCR conducts heavily. Once
SCR starts conducting, the gate loses its control, SCR cannot be switched off
by the gate voltage.

Fig:
3.19 VI characteristics of SCR
VAK is negative
When
VAK is negative, junction J1 and J3 are
reverse biased while the junction J2 is forward biased. Due to the
reverse bias of junction J1 and J3, no current flows
through the load RL. The current flowing through the SCR is very
small reverse saturation current. When the negative voltage at the anode is
increased, break down of junctions happens similar to zener breakdown which
damages SCR. SCR cannot be used as switch with negative VAK.
SCR Properties
- SCR can be switched ON by
positive anode voltage.
- Positive gate voltage makes
SCR to switch ON at lower positive anode voltages.
- When SCR is in ON condition
it cannot be switched OFF by gate voltage.
- The anode voltage is to be
reduced, to reduce the current below holding current in order to switch
OFF the SCR.
- SCR cannot be used with
negative anode voltage.
- SCR is unidirectional
switch.
4.1
PHOTOCONDUCTIVITY
When light in the form of photons
strikes the semiconductor, each
photon delivers energy to the electrons. If the photon energy is greater than
the energy hand gap of the semiconductor,
free mobile charge carriers are liberated and, as a result, resistivity of the semiconductor is decreased, so
conduction starts. This Process of generating electric current from incident
light is called photoconductivity.
4.2 LIGHT DEPENDENT
RESISTOR(LDR) OR PHOTORESISTOR:
It
is a semiconductor device whose resistance varies inversely with the intensity
of light falls upon it. It is also
known as photoresistive cell or photoresistor because it operates
on the principle of photoresistivity.
when light in
the form of photons strikes the semiconductor, each photon delivers energy to the electrons. If the photon energy is
greater than the energy hand gap of the semiconductor, free mobile charge carriers are liberated and, as a
result, resistivity of the semiconductor
is decreased, so conduction starts.
Photoconductive
cells are generally made of cadmium compounds such as cadmium sulphide {CdS) and
cadmium selenide (CdSe).

Fig:
3.25 circuit Symbol
A photoconductive
cell is an inexpensive and simple detector which is widely used
in OFF/ON circuits, light-measurement and
light-detecting circuits.

Fig:
3.26 (a) Characteristics curve of LDR, (b) Basic structure of LDR
There are two types of LDR
·
Intrinsic photo resistor(Pure semiconductors
are used for construction)
·
Extrinsic photo resistor(Doped semiconductors
are used for construction)
Application
- Light detector
4.3 PHOTODIODES
A photodiode is a type of photodetector capable of
converting light into either current or voltage.
A photodiode is a
two terminal PN junction device, which operates in a reverse bias. It
has a small transparent window, which allows light to strike the PN junction.

Fig: 3.27
Photodiode
Photodiode
produces reverse current in the
reverse bias by thermally generated electron-hole pairs in the depletion layer, which are swept across the junction by the electric field created by the reverse voltage.
Its reverse current increases with the light intensity at the
PN junction When there is no incident light,
the reverse current is almost
negligible and is called the dark current. An increase in the amount of light
energy produces an increase in the
reverse current for a given value of reverse-bias voltage.

Fig: 3.28 Characteristic curve of a
photodiode
Applications
1. Used in consumer electronic
device such as compact disc (CD) players, smoke detectors, and the receivers for infrared remote control equipments from
televisions to air-conditioners,
2. Used or
accurate measurement of light intensity in science and industry. The
photodiodes have more linear response than photo-conductors.
3.
Widely used in
medical applications such as detectors for computer tomography, instruments to analyze samples pulse oximeters.
4.
Because of
their fast switching speed, used for optical communication and in lighting regulation.
5.
Optical communication systems
6.
Character
recognition
7.
Encoders etc.
4.4 AVALANCHE
PHOTO DIODE (APD)
ADP
is used in optical communication for detection of light at the receiving end.
It converts the input light energy into electrical energy.
It essentially consist of reverse biased PN junction. The
depletion region in the reverse biased PN junction is formed by immobile
positively charged donor atoms in the N-type semiconductor material and
immobile negative charged acceptor atoms in the P-type material. The electric
field in this depletion region is very high where most of the photons are
absorbed and primary charge carriers (electron-hole pair) generated. There
charge carriers acquire sufficient energy from the electric field to excite new
electron hole pair by this process known as impact ionization.
These new
carriers created by impact ionization can themselves produce additional
carriers by the same mechanism. For this process, APD requires a high reverse
bias voltage in the order of 100- 400 V. carrier multiplication factors as
greater as 104 may be obtained using defect free materials. Electron-hole pair
thus generated separate and drift under the influence of the electric field in
the depletion region and diffuse outside the depletion region so that they are
finally collected in the detector terminals. This leads to a flow of current in
the external circuit whose magnitude is proportional to the intensity of light
incident on APD.

Fig: 3.29 Structure of APD
Due to the
internal gain mechanism in an APD, a large electrical response is obtained even
for a weak input signal. Quantum efficiency closer to 100% in the working
region can be obtained.
4.5
PHOTOTRANSISTOR
It
is light-sensitive transistor and is similar to an ordinary bipolar junction
transistor (BJT) except that it has no connection to the base terminal. Its operation
is based on the photodiode that exists at the CB junction. Instead of the base
current, the input to the transistor is provided in the form of light.
Silicon
NPN are mostly used as phototransistor. The device is usually packed with a
lens on top although it is sometimes encapsulated in clear plastic. When there
is no incident light on the CB junction, there is a small thermally-generated
collector-to-emitter leakage current ICEO which, in this case, is
called dark current and is in the nA range
When
light is incident on the CB junction, a base current I λ is produced
which is directly proportional to the light intensity. Hence, collector current
IC=βI λ
The
photo-transistor has the advantages of greater sensitivity and current capacity than photodiodes, However,
photodiodes are faster of the two switching in less than a nanosecond.

Fig: 3.30 (a) structure of phototransistor, (b) characteristic curve of
Phototransistor
4.6 OPTOCOUPLER
An optocoupler is a solid-slate component in which the
Light emitter, the light path and the
light detector are all enclosed within the component and cannot be changed externally. As the optocoupler provides
electrical isolation between circuits, it is also called optoisolator. An optoisolator allows signal transfer
without coupling wires,
capacitors or transformers. It can couple digital (ON/OFF) or analog (variable) signals.

Fig: 3.31 Schematic representation of the optocoupler
Optoisolator consists of an infrared LED and a photodetector such as PIN
photodiode for fast switching.
Optoisolators
transduce input voltage to proportional light intensity by using LEDs. The light is transduced back to output
voltage using light sensitive devices, GaAs.
The wavelength response of each device is made to be as
identical as possible to permit the
highest measure of coupling possible. There is a transparent insulating cap
between each set' of elements embedded in the structure (not visible) permit the passage of light. They are designed with
very small response times in such a way that they can be used to transmit data in the MHz range.
Optoisolator is used as an interface
between high voltage and low voltage systems. Application for this device includes the interfacing of different
types of logic circuits and their use in level-and-
position-sensing circuits.
The switching time of an optoisolator decreases with increased current, while for
many devices it is exactly the reverse.
5.1 RECTIFIERS
Rectifier
is defined as an electronic device used for converting (A.C) voltage into
unidirectional voltage (D.C). i.e. A.C.
voltage into a pulsating D.C. voltage
·
Half wave Rectifier
·
Full wave Rectifier
5.2 HALF-WAVE RECTIFIER (A.C. voltage into a pulsating D.C. voltage)

Fig: 5.1 (a) Basic structure of half-wave
rectifier, and (b) input output waveforms of half wave rectifier
Let Vi be the voltage to the primary
of the transformer and given by the equation
![]()
where Vγ
is the cut-in voltage of the diode.
During
positive half cycle, the diode D is in Forward bias condition. Diode conduct.
During
negative half cycle, the diode D is in reverse bias condition. Diode does not
conduct.




The
rms voltage at the load resistance can be calculated as





![]()




Peak Factor

5.3 FULL-WAVE RECTIFIER (A.C. voltage into a pulsating D.C. voltage)
It
uses two diodes of which one conducts during one half-cycle while the other
diode conducts during the other half-cycle of the applied ac voltage. There are
two types of full-wave rectifiers viz. (i) center tapped transformer full-wave rectifier and (ii) bridge rectifier.
During positive half-cycle, diode D1
forward bias, conducts current and
diode D2 reverse bias, does not conduct.
During negative half-cycle, diode D2 forward bias,
conducts current and diode D1 reverse bias, does not conduct.

Fig: 5.2 (a) Full-wave Rectifier,
(b) input and output waveform
RIPPLE FACTOR (Г)

The average voltage or dc voltage available across the load resistance is
![]()

Therefore,

Efficiency (η): The
ratio of dc output power to ac input power is known as rectifier efficiency (η)
![]()

The
maximum efficiency of a full-wave rectifier is 81.2%
and![]()
If the diode forward resistance (rf) and the transformer
secondary winding resistance (rs) are included in the analysis, then
![]()
![]()
Transformer Utilisation Factor
(TUF)
The average TUF in a full-wave rectifying circuit is determined by considering
the primary and secondary winding separately and it gives a value of 0.693
Form
factor
Form
factor =![]()

Peak
factor
Peak
factor=
Peak
inverse voltage for full-wave rectifier is 2Vm because the entire secondary voltage
appears across the non-conducting diode.
5.4 BRIDGE RECTIFIER (A.C.
voltage into a pulsating D.C. voltage)
The
need for a center tapped transformer in a full-wave rectifier is eliminated in
the bridge rectifier.
For
the positive half-cycle of the input ac voltage, diodes D1, and D3
conduct, whereas diodes D2
and D4 do not conduct. The conducting diodes will be in series through the load resistance RL.
So the load current flows through RL.

Fig: 5.3 (a) Bridge rectifier, (b) input
and output waveforms
During
the negative half-cycle of the input ac voltage, diodes D2 and
D4 conduct,
whereas diodes D1 and D3 do not conduct.
The conducting diode D2 and D4 will be in series through the load RL
and the current flows through RL in the same direction as in the previous
half-cycle. Thus a bidirectional wave is converted into a unidirectional one.
The average values of output voltage and
load current for bridge rectifier are the same as for a center-tapped full wave
rectifier. Hence,

If
the values of the transformer secondary winding resistance (rs) and
diode forward resistance (rf)
are considered in the analysis, then

The
maximum efficiency of a bridge rectifier is 81.2% and the ripple factor
is 0.48. The PIV is Vm
Advantages of the
bridge rectifier
The
ripple factor and efficiency of the rectification are the same as the full-wave rectifier.
The bulky center
tapped transformer is not required. Transformer utilization factor is
considerably high. Since the current flowing in the transformer
secondary is purely alternating, the TUF increases to 0.812.
Disadvantage is it requires four. But the diodes are cheaper. Apart from
this, the PIV rating required for the diodes in a bridge rectifier is only half of that for a
center tapped full-wave
rectifier, this is a great advantage.

5.5 FILTERS
The ripple in the rectified
(contains dc and ac component) wave being very high, the factor being 48% in
the full-wave rectifier; majority of the applications which cannot tolerate
this. Filters are used to minimise the undesirable ac, i.e. ripple leaving only
the dc component to appear at the output.
The
full wave rectified output voltage is applied at filters input. The output of a
filter is not exactly a constant dc level. But it also contains a small amount of ac
component. Some important filters arc:
(a)
Inductor filter
(b)
Capacitor filter
(c)
LC or L-section filter,
(d)
and CLC
or π-type filter

Fig: 5.4 concept of filter
5.6 CAPACITOR
FILTER
An inexpensive filter for light loads is found in the
capacitor filter which is connected directly across the load, as shown in Fig.
5.6 (a). The property of a capacitor is that it allows ac component and blocks
the dc component.
During the
positive half-cycle, the capacitor charges up to the peak value of the
transformer secondary voltage, Vm, and will try to maintain this value as the
full-wave input drops to zero. The capacitor will discharge through RL slowly
until the transformer secondary voltage again increases to a value greater than
the capacitor voltage. The diode conducts for a period which depends on the capacitor
voltage (equal to the load voltage). The diode will conduct when the
transformer secondary voltage becomes more than the 'cut-in’ voltage of the
diode. The diode stops conducting when the transformer voltage becomes less
than the diode voltage. This is called
cut-out voltage.
From the cut-in
point to the cut-out point, what-ever charge the capacitor acquires is equal to the charge
the capacitor has lost during the period of non-conduction.

Fig: 5.6 (a) Capacitor filter, (b) Ripple
voltage triangular waveform

If the
value of the capacitor is fairly
large, or the value of the load resistance is very large, then it can be assumed that the time T2 is
equal to half the periodic time of the
waveform .i.e.
![]()
With
the assumptions made above, the ripple waveform will be triangular in nature
and the rms value of the ripple is given by




6.1 VOLTAGE
REGULATION USING ZENER DIODE (Gives Constant Output Voltage)
A voltage regulator is an electronic
circuit that provides a stable DC voltage independent of the load current,
temperature and ac line voltage variations.
The
quality of the regulation specified by (i) Line regulation and (ii) Load
regulation. For a good regulator the line and load regulation should be minimum
value.
6.2 ZENER DIODE
SHUNT REGULATOR
The zener diode is
selected with Vz equal to the voltage desired across the load. The zener diode
has a characteristic that under reverse bias condition, the voltage across
it practically remains constant, even if the current through it changes by a
large extent. Under normal conditions, the input current Ii=IL+IZ
flows through resistor R. The input voltage Vi can
be written as
Vi=IiR+VZ=
(IL+IZ)R+VZ

Fig: 5.11 Zener voltage Regulator
When
the input voltage Vi increases (say due to supply voltage
variations), as the voltage across zener diode remains constant, the drop
across resistor R will increase with a corresponding increase in IL + Iz. As
Vz is a constant, the voltage across the load will also remain constant and
hence, IL will be a constant. Therefore, an increase in
IL + IZ will result in an increase in Iz
which will not alter the voltage across the load.
It
must be ensured that the reverse voltage applied to the zener diode never
exceeds PIV of the diode and at the same time,
the applied input voltage must be greater than the breakdown voltage of the zener diode for its operation. The zener
diodes can be used as 'stand-alone' regulator
circuits and also as reference voltage sources.
LINE REGULATION
A change in input voltage to a
regulator will cause a change in its output of load voltage. Line regulation is
defined as the change in output voltage for a change in line supply voltage keeping the load
current and temperature constant. Line regulation is given by
![]()
LOAD REGULATION
Voltage regulator will experience a slight
change in output voltage when there is a change in load current demand (i.e.,
Full load voltage).
![]()
7.1 SENSOR
A
sensor is a device that detects the change in the environment and responds to
some output on the other system. A sensor converts a physical phenomenon into a
measurable analog voltage (or sometimes a digital signal) converted into a
human-readable display or transmitted for reading or further processing.
One of
the best-known sensors is the microphone, which converts sound energy to an
electrical signal that can be amplified, transmitted, recorded, and reproduced.
7.2 TYPES OF SENSORS
·
Passive Sensor
·
Active Sensor
7.2.1 PASSIVE SENSOR
A passive sensor is a microwave
instrument designed to receive and to measure natural emissions produced by
constituents of the Earth's surface and its atmosphere.
7.2.2 ACTIVE SENSOR
An active sensor is a radar instrument used for measuring signals
transmitted by the sensor that were reflected, refracted or scattered by the
Earth's surface or its atmosphere.
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